摘要
使用溶胶-凝胶法制备了Eu掺杂SiO2(Eux^n+∶SiO2)薄膜,Eu与SiO2的物质的量比分别为5%、10%、15%和20%。利用X射线衍射仪(XRD)、傅里叶红外光谱仪(FT-IR)、显微维氏硬度计、万能试验机以及接触角测量仪等研究了薄膜结构及其性能。研究结果表明,Eu掺杂使SiO2薄膜更容易析晶;Eu掺杂可以提高SiO2薄膜的透过率,提高基体的硬度并改善其弯曲强度,同时,Eu掺杂还能进一步提高薄膜的亲水性。但Eu掺杂量过高时(Eu与SiO2的物质的量比大于10%),薄膜的强度有所下降,脆性增加,对基体薄膜性能产生不利影响。
Eu doping SiO 2(Eux^n+∶SiO2)thin films were prepared by sol-gel method,and the molar ratio of Eu to SiO 2 were 5%,10%,15%and 20%respectively.The structure and properties of the films were studied by X-ray diffraction(XRD),Fourier transform infrared spectroscopy(FT-IR),microscopic Vickers hardness tester,universal testing machine and contact angle measuring instrument.The results show that the Eu doping can make the film easier to crystallize,and it can improve the sample transmittance significantly,improve the bending strength of the sample and raise its hardness.Eu doping can also further improve the hydrophilic of the film.However,excessive Eu doping(the molar ratio of Eu to SiO2 is greater than 10%)can have an adverse effect on the film.
作者
王海风
王若轩
董云谷
刘鑫
WANG Haifeng;WANG Ruoxuan;DONG Yungu;LIU Xin(College of Materials Science and Engineering,Donghua University,Shanghai 201620;Engineering Research Center of Advanced Glass Manufacturing Technology,Ministry of Education,Donghua University,Shanghai 201620)
出处
《材料导报》
EI
CAS
CSCD
北大核心
2019年第S02期165-168,共4页
Materials Reports
