摘要
采用新的化学抛光方法处理HGEM膜,在不同的气体成分和比例下对THGEM膜的增益和能量分辨进行研究测量.结果表明,以Ar/C4H10为工作气体的THGEM探测器所需工作电压较低、增益高、能量分辨相对较好.在Ar/C4H10(95%/5%)的气体条件下,THGEM的增益可达7×10^3.
THGEM films were treated by a new chemical polishing method in this experiment. The gain and energy resolution of THGEM films were measured under different gas composition and proportion. The optimal gas selection scheme (Ar/C4H10) is obtained. Under this gas, for THGEM, by using relatively low work voltage, high gain and relatively high energy resolution could be obtained. The experimental result indicated that the highest gain is 7×10^3when the detector work in Ar/C4H10(95%/5%).
作者
谢文锦
赵子喻
覃潇平
刘熙文
黄雪峰
黄博
封焕波
刘倩
刘宏邦
XIE Wen-jin;ZHAO Zi-yu;QIN Xiao-ping;LIU Xi-wen;HUANG Xue-feng;HUANG Bo;FENG Huan-bo;UU Qian;LIU Hong-bang(Guangxi University,Nanning 530004,China;Zhejiang University,Hangzhou 310027,China;University of Chinese Academy of Sciences,Beijing 100049,China)
出处
《核电子学与探测技术》
CAS
北大核心
2019年第3期297-300,共4页
Nuclear Electronics & Detection Technology
基金
国家自然科学基金(U1731239)
广西自然科学基金(2018GXNSFGA281007)
广西高等学校高水平创新团队及卓越学者计划资助
