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受激辐射损耗超分辨荧光成像探针研究进展 被引量:3

Research progress on stimulated emission depletion using fluorescent probes
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摘要 受激辐射损耗超分辨成像可突破光学衍射极限的限制,获得纳米尺寸结构的超精细图像,荧光探针发挥了重要作用。本文主要介绍了受激辐射损耗超分辨显微成像的相关概念,包括基础光学概念、受激辐射损耗超分辨成像原理、成像系统,总结了受激辐射损耗超分辨成像荧光探针及其应用等研究进展,相信本工作能帮助化学、化工领域相关工作者了解受激辐射超分辨成像研究及其生物成像应用,尤其是可以用于该成像技术的荧光探针的相关知识,为设计、制备有效的受激辐射超分辨荧光探针提供设计思路。本文为荧光探针在生物医学光学领域的应用提出了新的需求与机遇,为化学、化工领域相关研究方向与光学成像领域的深度交叉与融合提供了新的发展契机。 Stimulated emission depletion super-resolution microscopy(STED) can overcome the limit of optical diffraction to achieve the ultra-fine imaging of nanoscale of targets. The fluorescent probes play great roles in this technique. In this paper, the basic concept of STED microscopy was introduced, including the basic optical concept, principle of STED microscopy and imaging system, and STED fluorescent probes and the biological applications were summarized. This paper would be beneficial to the researchers from the fields of chemistry and chemical engineering in understanding of fundamental theory of superresolution imaging microscopy, which is helpful for the design of effective fluorescent probes in STED superresolution imaging. This review also provided the new requirement for fluorescent probes in biomedical imaging area, and the new opportunity for the joint disciplines in chemistry and chemical engineering with optical imaging.
作者 刘毋凡 陈楚芳 潘文慧 熊佳 屈军乐 杨志刚 LIU Wufan;CHEN Chufang;PAN Wenhui;XIONG Jia;QU Junle;YANG Zhigang(Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province, College ofOptoelectronic Engineering, Shenzhen University, Shenzhen 518060, Guangdong, China)
出处 《化工进展》 EI CAS CSCD 北大核心 2019年第2期726-739,共14页 Chemical Industry and Engineering Progress
基金 深圳市基础科学研究自由探索项目(JCYJ20170818100931714) 国家自然科学基金(61875131/21406125)
关键词 成像分辨率 超分辨成像 受激辐射 受激辐射损耗超分辨成像 超分辨成像探针 imaging resolution superresolution imaging stimulated emission stimulated emission depletion superresolution imaging microscopy superresolution imaging probes
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