摘要
本文利用概率统计知识研究了长期能力与短期能力的数据转换,证明了长期能力过程均值漂移的典型偏离值,给出了不同漂移情况下的过程能力指数及产品合格品率。
The paper researches date transform of long term ability and short term ability by using probability and statistics. Then it deliberates typical drift transistor value of long term process by using ONOVA,and last gives the process capability indices in different shift cases and rates of product is up to standard.
出处
《世界标准化与质量管理》
2002年第9期35-37,共3页
World Standardization & Quality Management
