摘要
针对FPGA芯片中CLB模块的测试难点,主要介绍了对FPGA芯片进行内建自测试的一种测试方法。在CLB模块中采用内建自测试分别对CLB模块的三态缓冲器、触发器、分布式RAM、CLB内部进位链与门、锁存器、算数逻辑、多路选择器MUXF6、移位寄存器进行测试,从而达到了缩短测试时间、全覆盖测试的目的。
Because the CLB module of FPGA chip is difficult to test, the article mainly introduces BIST test method for the FPGA chip. In the CLB module, using the BIST separately test on the CLB module of the three state buffers, flip flops, distributed RAM, CLB internal carry chain, door latch, arithmetic logic, MUXF6, shift register, so as to shorten the testing time, reach the purpose of full coverage testing.
出处
《电子与封装》
2015年第8期17-20,共4页
Electronics & Packaging
