摘要
本文通过对发光二极管受热后不亮或者点亮不稳定的失效现象进行分析研究,结合了发光二极管生产工艺,确定了发光二极管的各种热失效原因以及相应的管控措施,并通过实验验证模拟复现故障现象,确定了一种有效的提前发现发光二极管热失效的极限耐热实验方法。
In this paper, the failure phenomenon of the light emitting diode being unable to be lighted or work stably after heated was analyzed. All kinds of the thermal failure reasons and the corresponding control measures were confirmed by combining the production technology of the light emitting diode. The failure phenomenon could be simulated out by an extreme heating experiment, which could find out the thermal failure of the light emitting diode in advance effectively.
出处
《日用电器》
2015年第8期114-117,共4页
ELECTRICAL APPLIANCES
关键词
发光二极管
热失效
金线绑定
极限耐热实验
light emitting diode
thermal failure
gold thread binding
extreme heating experiment
