摘要
动态回路电阻测量是一种高压SF6断路器触头诊断技术。由于动态回路电阻测量过程中存在较严重的扰动现象,导致其特征量计算困难,并且严重影响触头烧蚀状态的评估。通过研究不同烧蚀程度下的高压SF6断路器的动态回路电阻曲线,发现动态回路电阻测量曲线上的扰动现象主要包括3种:波动、窄脉冲(几μs)和宽脉冲(几十到几百μs)。试验电路仿真分析结果表明:在动态回路电阻测量中,动静触头的相对运动造成动态回路电阻波动,波动可以反映触头的表面形态;主触头和弧触头之间的电流转移导致动态回路电阻波形上出现窄脉冲,因此窄脉冲是主触头分离的标志;触头弹跳和弧触头之间的燃弧导致动态回路电阻波形上出现宽脉冲,因此宽脉冲可作为弧触头分离的标志。窄脉冲和宽脉冲可作为关键特征量,用于更加准确地计算触头分离时刻和评估触头烧蚀状态。
Dynamic contact resistance measurement(DRM) is an effective technique for assessing the contact condition of high voltage SF6 circuit breaker. Due to fluctuations in dynamic resistance curves, difficulties are often faced in the calculation of the DRM features and the evaluation of the contact condition. The dynamic contact resistance curves of a high voltage SF6 circuit breaker at different wear stages are investigated, and three kinds of fluctuations are found, namely, vibration, narrow pulse(several μs), and wide pulse(ranged from dozens μs to hundreds μs). Simulation of the dynamic contact resistance measurement is performed to investigate their mechanism. Conclusions are drawn as follows. The vibration on the resistance curves is due to the relative motion of the contacts in DRM tests, and it indicates the surface condition of the contacts. The narrow pulse is caused by the current commutation from the main contacts to the arcing contact, thus it is the mark of the main contacts separation. The wide pulse is due to the contact bounce and the arc ignition between the arcing contacts, thus it is the mark of the arcing contacts separation. Narrow pulse and wide pulse are key features which are used to determine the separation time of the contacts and to evaluate the contact condition.
作者
程亭婷
高文胜
赵宇明
张欣
姚森敬
CHENG Tingting;GAO Wensheng;ZHAO Yuming;ZHANG Xin;YAO Senjing(Department of Electrical Engineering,Tsinghua University,Beij ing 100084,China;Shenzhen Power Supply Company,Shenzhen 518000,China)
出处
《高电压技术》
EI
CAS
CSCD
北大核心
2018年第11期3604-3610,共7页
High Voltage Engineering
基金
中国南方电网有限责任公司科技项目(20142001342)~~
关键词
SF6断路器
触头
动态电阻测量
扰动现象
烧蚀
故障诊断
SF6 circuit breaker
electrical contact
dynamic resistance measurement
fluctuation
erosion
fault diagnostic