摘要
小缺陷的识别与测量是工业CT工程应用中的难点之一。工业CT工艺参数的选择是影响断层扫描图像质量的重要因素。对于小缺陷的检测来说,细节特征的识别和测量精度与切片厚度、微动次数以及触发次数等工艺参数有直接关系。以6 MeV线阵高能工业CT为例,通过理论分析和试验研究各工艺参数对小缺陷测量精度的影响,得出特定条件下的最佳工艺参数,最终给出小缺陷检测时工艺参数的选择方法,为工业CT工程应用中的缺陷检测和工艺卡的编写提供指导和借鉴。
The identification and measurement of small defects is one of the difficulties in industrial CT engineering applications.The selection of industrial CT process parameters is an important factor affecting the quality of tomographic images.For the detection of small defects,the identification and the measurement precision of detail features have a direct relationship with the process parameters such as slice thickness,fretting times,and triggering times.Taking 6 MeV linear array high-energy industrial CT as an example,the optimum process parameters under certain conditions were inferred after the investigation of the influence of each process parameters on measurement precision of small defects through theoretical analysis and experimental research.Finally,the selection method of process parameters for small defect detection was given,which provides guidance and reference for defect detection and process card writing in industrial CT engineering application.
出处
《兵器材料科学与工程》
CAS
CSCD
北大核心
2018年第1期110-115,共6页
Ordnance Material Science and Engineering
基金
国家自然科学基金(61471411)
浙江省自然科学基金(LQ15E010003)
宁波市自然科学基金(2016A610247)
宁波国际科技合作项目(2015D10005)
关键词
工业CT
工艺参数
小缺陷
测量精度
industrial CT
process parameters
small defects
measurement accuracy
