摘要
随着工艺特征尺寸逐渐趋近于纳米级,SRAM型FPGA越来越容易受到空间辐射环境的影响而导致系统故障.为了提高SRAM型FPGA在空间环境的可靠性,在对Xilinx系列SRAM型FPGA的单粒子效应故障模式进行分析的基础上,重点介绍了几种抗单粒子翻转方法,并对各种方法的适用范围、使用特点及应用情况等进行了比较分析.结果表明:选用基于SelectMAP接口和用户可自定义的纠检错方式实现对SRAM型FPGA的回读、纠检错和刷新设计;选择动态重配置设计方法实现系统的在线全部和部分重构设计是最为有效的可靠性设计方法.该回读、纠检错、刷新和部分重构设计方法已经在嫦娥五号试验器中得到在轨成功实施与验证.
With the high-speed development of CMOS circuits, the effects of space radiation, especially the influence of single event upsets is particularly significant for the SRAM-based FPGA. In order to improve its reliability, several SEU-tolerant methods of the SRAM-based FPGA were analyzed. The result showed that user defined error correcting, dynamic scrubbing and partialrebuilding are the most effective methods for reliability design. These fault-tolerant methods were successfully implemented in the No. five re-entry flight experiment device.
出处
《南通大学学报（自然科学版）》
CAS
2016年第3期25-32,40,共9页
Journal of Nantong University(Natural Science Edition)
