摘要
通常金属试件表面零厚度光栅在800~1 000℃下就发生氧化和低固溶点金属的溢出,导致试件表面的光栅被完全覆盖,无法继续测量。本文通过特殊的物理方法处理,使试件表面光栅重新显现,从而获得1 200℃下清晰的干涉条纹,成功测试该温度下单晶材料的弹性模量和泊松比。
The zero-thickness grating of the metal specimen surface will be oxidized and overflowed by lowing melting point metals from 800 to 1000℃. The grating will be completely covered and cannot continues to be measured, A new special physical approach was proposed to reappear the grating, then the clear interference stripes were abtained at 1200℃. Young＇s modu lus and Poisson＇s ratio of the high temperature alloys at 1 200℃could be tesed.
出处
《应用激光》
CSCD
北大核心
2016年第4期434-439,共6页
Applied Laser
关键词
云纹干涉
1
200℃
弹性模量
泊松比
moire interferometer
1 200 ℃
young＇s modulus
poisson＇s ratio
