摘要
Y2002-63302-144 0304962采用扩展电阻探针测量的金属感应横向晶体化区域的电特性=Direct electrical characterization of metal-in-duced-lateral-crystallization regions by spreading resis-tance probe measurements[会,英]/Leung,T.C.&Cheng,C.F.//2001 IEEE Hong Kong Electron DevicesMeeting.—144～147(E)
出处
《电子科技文摘》
2003年第3期8-9,共2页
Sci.& Tech.Abstract
