摘要
采用配备放电离子化检测器(DID)的GOW–MAC 816气相色谱仪,利用中心切割技术对六氟乙烷主组分进行切割,避免其进入检测器系统,从而能够准确地分析出电子级六氟乙烷中微量杂质的含量。该方法简捷,方便,灵敏度高。
The hexafluoroethane main component was cut by the GOW-MAC 816 gas chromatograph equipped discharge ionization detector（DID） using the central cutting technique in order to prevent it from entering into the detector system, so that the trace impurity content in the electronic grade hexafluoroethane can be accurately analyzed. This method is simple, convenient and highly sensitive.
出处
《化学推进剂与高分子材料》
CAS
2015年第5期92-94,共3页
Chemical Propellants & Polymeric Materials
关键词
六氟乙烷
放电离子化检测器
气相色谱
中心切割
hexafluoroethane
discharge ionization detector
gas chromatogram
central cutting
