期刊文献+

参数测量模型中包含复数的测量不确定度的评定

Evaluating of Measurement Uncertainty for Parameters whose Measurement Model Contains Complex Variable
下载PDF
导出
摘要 论文给出了用于评定测量模型中包含复数变量参数的测量不确定度评定方法,该方法基于现行有效的JJF1059.1-2012《测量不确定度评定与表示》和JJF 1059.2-2012《用蒙特卡洛法评定测量不确定度》,通过将复数转换为实部和虚部表示的形式,使得复数变量可以按照现行不确定度评定方法进行评定,并且给出了不确定度评定实例。 Methods for evaluating the uncertainty of complex variable are presented in this paper.The methods are based on JJF 1059.1-2012 and JJF 1059.2-2012.It can evaluate the uncertainty of complex variable according to existing methods.At last,an example is presented to show how to use the method to evaluate uncertainty.
出处 《计算机与数字工程》 2015年第6期980-982,1000,共4页 Computer & Digital Engineering
关键词 复数变量 不确定度 GUM MCM complex variable, uncertainty, GUM, MCM
  • 相关文献

参考文献10

  • 1国家质量监督检验检疫总局.JJF1059.1-2012测最不确定度评定与表示[s].北京:中国质检出版社.2012. 被引量:1
  • 2国家质量监督检验检疫总局.JJF1059.2-2012用蒙特卡洛法评定测量不确定度[s].北京:中国质检出版社,2012. 被引量:1
  • 3ISO/IEC. Guide to the expression of uncertainty in rneasurementS. Geneva, Switzerland: International Organization for Standardization, 1998. 被引量:1
  • 4RIDLER N M, SALTER M J. Evaluating and express- ing uncertainty in complex S-parameter measurements [C//Proceedings of the 56th ARFTG Microwave Measurements Conference. Boulder, Colorado, USA, 2000:1-13. 被引量:1
  • 5WONG K, Uncertainty analysis of the weighted least squares VNA calibrationEC//Proceedings of the 64th ARFTG Microwave Measurements Conference. Orlan do, FL, USA,2004.23-31. 被引量:1
  • 6SEVIC J. Theory of load and source pull measurement EEB/OL. [2015-04-22. http://www, maurymw. com/support/pdfs/5C2055, pdf. 被引量:1
  • 7Maury Microwave Corporation. Verification of power load-pull systems EEB/OL-. E2015-04-22-. http:// www. maurymw, com/support/pdfs/SC2041, pdf. 被引量:1
  • 8HALL B D. Calculations of measurement uncertainty in complex valued quantities involving uncertainty in the uncertainty[C-//Proceedings of the 64th ARFTG Mi- crowave Measurements Conference. Orlando, FL, USA, 2004 : 15-22. 被引量:1
  • 9HUANG H, LIU X M, LV X. Monte-Carlo Analysis of Measurement Uncertainties for On-wafer Short- Open-Load-Reciprocal Calibrations [ C]//Proceedings of the Asia-Pacific Microwave Conference. Melbourne, Australia, 2011 : 1778-1781. 被引量:1
  • 10FERRERO A, TEPPATI V, CARULLO A. Accura- cy evaluation of on-wafer load-pull measurements[J]. IEEE Transactions on Microwave Theory and Tech- niques, 2001,49(1) : 39-43. 被引量:1

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部