摘要
针对扫描隧道显微镜的针尖腐蚀系统,提出了一种新的电路,改变了反应电流的测量机制,克服了以往腐蚀过程中电压变化的缺点,提高了针尖制作的成功率。在此基础上对比了新旧两种电路的效果,并测量了腐蚀电压,截止电流以及钨丝浸入长度对针尖质量的影响,发现反应参数的改变对针尖特征的影响是多方面的,必须均衡考虑才能提高成功率,最后,作者在合适的参数条件下观察了整个腐蚀过程,并检测了针尖的使用效果。
A new type of circuit was designed for tip preparation for Scanning Tunneling Microscope, which changed the method for detecting the current. The problem of instability of the voltage during the reaction was resolved, which improved the success rate. On the basis of this design, we compared the results of new and old circuits and detected the effect of voltage, cutoff current, and the length of tungsten wire in electrolyte on the tip quality. It was found that the change of the reaction parameter affected several aspects of the tips, which should be balanced for success. Finally, we observed the whole reaction process, and used the tip to obtain the STM image.
出处
《电子显微学报》
CAS
CSCD
2015年第2期111-120,共10页
Journal of Chinese Electron Microscopy Society
基金
国家自然科学基金资助项目(No.51207016
No.51477023)
