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Nb-Si-N纳米复合薄膜表面吸附与迁移的第一性原理研究 被引量:3

Surface adsorption and diffusion of Nb-Si-N nano-composite films:a first principles study
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摘要 针对Nb-Si-N纳米复合薄膜在沉积过程中各原子的成核过程和生长取向,采用基于密度泛函理论(DFT)第一性原理超软赝势平面波计算方法分别计算了Nb、Si、N各单原子在NbN(001)表面6个对称位的吸附作用和迁移过程。吸附作用的计算获得各原子的势能面,其中Nb在NbN(001)表面最低能量位置为HL位,N、Si最低能量位置处于HL位与TopN位之间。势能面计算结果确定各单原子在NbN(001)表面迁移的路径分别为,Nb原子和Si原子均为从TopN位置迁移到HL位置;N原子分别从TopNb位置和TopN-HL位置迁移到HL位置。Nb、Si、N各单原子在NbN(001)表面迁移激活能分别为0.32,0.69和1.32eV。 The adsorption and pathways processes of atomistic Nb,Si and N at some high symmetry sites on NbN(001)surface were studied with the first principle method which is based on density functional theory(DFT).The investigation presents some results.The potential energy surface(PES)was obtained by calculating the adsorption of Nb,Si and N atom on NbN(001).Nb atom on NbN(001)surface of the lowest energy position was HL,but,lowest energy position of N and Si atom between the HL and TopN.By the results of potential energy surface calculations,the minimum energy paths(MEP)of the single-atom on NbN(001)surface diffusion:Nb and Si atom were diffused from TopN to HL position;N atom was diffused from TopNb and the TopN-HL to HL position respectively.The diffusion energy of Nb,Si and N atom on NbN(001)surface were0.32,0.69 and 1.32 eV,respectively.
出处 《功能材料》 EI CAS CSCD 北大核心 2015年第5期5089-5094,共6页 Journal of Functional Materials
基金 国家自然科学基金资助项目(50845065) 内蒙古自治区自然科学基金资助项目(2014MS0516 2010Zd21) 内蒙古科技大学创新基金资助项目(2012NCL050)
关键词 Nb-Si-N 表面吸附 表面迁移 密度泛函计算 niobium nitride surface adsorption surface diffusion density functional calculation
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  • 1[1]Veprek S,Niederfoher A,Moto K,et al.Composition,nanostructure and origin of the ultrahardness in nc-TiN/a-Si3N4/a-and nc-TiSi2 nanocomposites with HV=80 to≥105 GPa[J].Surf & Coat Technol,2000,133-134:152-159. 被引量:1
  • 2[2]Ding X Z,Zeng X T,Liu Y C,et al.Structure and mechanical properties of Ti-Si-N films deposited by combined DC/RF reactive unbalanced magnetron sputtering[J].J Vac Sci Technol A,2004,22 (6):2351-2355. 被引量:1
  • 3[3]Ribeiro E,Rebouta L,Carvalho S,et al.Characterization of hard DC-sputtered Si-based TiN coatings:The effect of composition and ion bombardment[J].Surf & Coat Technol,2004,188-189:351-357. 被引量:1
  • 4[4]Veprek S.Conventional and new approach towards the design of novel superhard materials[J].Surf & Coat Technol,1997,1-3:15-22. 被引量:1
  • 5[5]Fu T,Zhou Z F,Li K Y,et al.Characterization of sputter deposited W-Si-N coatings based on alpha-W structure[J].Materials Letters,2005,59(6):618 -623. 被引量:1
  • 6[8]Germany Normal.DIN 50359-1:1997-10.Universal h(a)rteprüfung[S]. 被引量:1
  • 7[9]Oliver W C,Pharr G M.An improved technique for determining hardness and elastic modulus using load and displacement sensing indentation experiment[J].J Mater Res,1992,7(6):1564-1583. 被引量:1
  • 8[10]Veprek S,Veprek H,Maritza G J,et al.Different approaches to superhard coatings and nanocomposites[J].Thin Solid Films,2005,476(1):1-29. 被引量:1
  • 9[11]Nose M,Chiou W A,Zhou M,et al.Microstructure and mechanical properties of Zr-Si-N films prepared by rf-reactive sputtering[J].J Vac Sci Technol A,2002,20(3):823-828. 被引量:1
  • 10Sproul W D.Science,1996,273(16):889~ 892 被引量:1

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