摘要
为了实现自动测量石英晶片的频率等相关参数并进行分档,研究了石英晶片的图像定位技术,主要利用图像处理技术对采集的图像进行图像二值化、边缘检测、轮廓提取等处理,完成对石英晶片中心的定位。经验证,该石英晶片定位技术能够在保证系统要求的石英晶片分选速度的前提下实现石英晶片的准确定位。
In order to realize the automatic measurement and classification of quartz crystal frequency,and other related parameters,the quartz wafer positioning technology based on image processing is studied. The image binaryzation,edge detection and contour extraction for the acquired images are conducted by means of image processing technology to complete the positioning of the quartz wafer center. The verification result shows that the quartz wafer positioning technology can achieve accurate positioning of the quartz wafer under the premise of ensuring the system requirements of quartz wafer sorting speed.
出处
《现代电子技术》
北大核心
2015年第1期109-111,114,共4页
Modern Electronics Technique
基金
机电系统测控北京市重点实验室开放项目:石英晶片外观缺陷检测技术研究(5231423200)
关键词
石英晶片
定位技术
图像处理
自动分选
quartz wafer
positioning technology
image processing
automatic sorting
