摘要
介绍国防科工委光学计量一级站在红外光学材料主要参数计量测试方面的技术现状 ,包括测量参数。
The technique status of the Optical Metrology Station in measuring major parameters of infrared materials, including measurable parameters,working principle and technique specifications,is introduced in this paper.
出处
《应用光学》
CAS
CSCD
2001年第6期40-42,共3页
Journal of Applied Optics
