摘要
为探讨初级X射线与铝镀层和铀基体物质、铀的特征线与铝镀层之间的相互作用以及铀基体的放射性对测量铝厚度的影响程度 ,提出强度与镀层厚度关系的数学模型 ,以及在同一数学模型中 ,根据铝镀层厚度的实际情况分别选用铀的M和L线测定薄样和厚样。建立了无损测定铀材料上铝镀层厚度 (8.2— 5 5 .5 μm)的测试方法。对 8.2— 18μm的薄试样 ,方法的精密度优于3% ;对 18— 5 5 .5 μm的厚试样 ,方法的精密度优于 5 %。
The interaction between primary X-ray with Al plating and U matrix materials, characteristic X-ray with Al plating thickness and the effect of U matrix's radioactivity on measurement of Al thickness has been discussed. A mathematical model of the relationship between intensity and plating thickness has been developed. UM or UL X-ray has been selected by the model to measure the thin or thick samples respectively. A measuring method of Al plating thickness (8.2-55.5μm) on U matrix has been established. The precision is better than 3% for 8.2-18μm samples and better than 5% for 18-55.5μm samples.
出处
《核技术》
CAS
CSCD
北大核心
2001年第8期655-662,共8页
Nuclear Techniques
基金
中国工程物理研究院基金资助项目 ( 2 0 0 0 0 3 3 1)
