摘要
本文利用椭圆偏振光谱法研究了铝镓铟磷 (Al Ga In P)以及掺 Si样品 ,获得样品的光学常数随光子能量的变化关系和可见光区的介电函数谱 ;对该谱进行数值微分 ,得到介电函数的三级微商谱 ;应用介电函数的三级微商理论 ,求得样品的带隙 。
In this paper,the dependence of the optical constants on the photonenergy for two samples of intrinsic and doped Si Al xGa 0.51-x In 0.49 P were studied by using ellipsometric spectroscopy.The dielectric function spectra of two samples were obtained in the region of visible light,and the third derivative spectra of the dielectric function were evaluated.The energy gaps for two samples were analyzed by the third derivative theory.The energy gaps were gained and discussed.
出处
《光电子．激光》
EI
CAS
CSCD
北大核心
2001年第9期917-919,共3页
Journal of Optoelectronics·Laser
基金
山东大学青年科学基金资助项目
