摘要
本文提出一种根据输出端值的变化频度测试LSI/VLSI电路I/O线上的固定故障的方法。该方法的优点是不需待测电路功能函数,也不需标准电路作比较。文章同时讨论用软件和硬件的实现方法。
Based on testing the altering frequency of output values, a high efficient approach is presented in this paper to detect stuck-at faults on I / O linesof LSI / VLSI chips. It is interesting that the approach performed in this way works efficiently without knowing the detailed implementation of circuits under testing. The method of designing the testers is also discussed in this paper.
出处
《中国纺织大学学报》
CSCD
1995年第1期116-123,共8页
Journal of China Textile University
关键词
LSI
VLSI
集成电路
测试
fault diagnosis, frequency, logical design
stuck-at faults, input-output lines.
