摘要
借助扫描电子显微镜 - X射线能谱分析方法从超微结构和元素水平观测了三唑酮种衣剂包衣处理和空白对照的小麦幼苗上白粉病菌侵染及非侵染位点硅等元素含量的变化。结果表明 ,接种后2 0～ 36 h内三唑酮种衣剂处理的麦苗侵染位点细胞内元素硅含量由 5.2 0 4 %上升为 4 2 .0 6 4 % ,非侵染位点由 5.82 1%上升为 12 .342 % ;空白对照中侵染位点元素硅含量由低于检测水平上升为17.388% ,非侵染位点接种后 36 h时为 19.4 6 0 %。在处理和空白对照的麦苗上侵染和非侵染位点均检测到了含量不等的磷、硫、氯等元素存在。
Effect of triadimefon seed coating formulation (TriSCF) on the changes of the amount of silicon and other elements in infected and non infected sites by Erysiphe graminis on epidermal cell of wheat leaves was tested by means of SEM energy dispersive analysis of X ray. The results showed that in the epidermal cell of leaves of the wheat seedling coated with TriSCF 20 36 h after inoculation, the amount of silicon in the infection and non infection sites of Erysiphe graminis increased from 5.204% to 42.064%, 5.821% to 12.342%, respectively. In the untreated seedlings with the same inoculation time, the amount of silicon in the infection site increased from non testable level to 17.388%, the amount of silicon in non infection site was 19.460% 36 h after inoculation. The percentage of P, S, Cl, and other elements tested appeared differently in infected and non infected sites of the seedling from above treated and untreated seeds.
出处
《植物病理学报》
CAS
CSCD
北大核心
2001年第1期26-30,共5页
Acta Phytopathologica Sinica
基金
云南省省院省校科技合作项目! (99YN0 1)
中国科学院封丘农业生态实验站基金资助! (96 16 0 72 )
