摘要
针对软差错影响下的电路可靠性问题,选取了TP算法、EPP方法和PTM方法 3种门级电路可靠性评估方法,分别介绍其原理,并结合实验指出了它们的功能、适用范围以及复杂度.
To investigate the circuit reliability under the effect of soft errors, such three gatelevel circuit reliability estimation methods as TP algorithm, EPP method and PTM method are analyzed, whose function, complexity and extent of application are compared on experiments.
出处
《上海电力学院学报》
CAS
2014年第2期155-160,共6页
Journal of Shanghai University of Electric Power
关键词
电路可靠性
软差错
门级
信号概率
circuit reliability
soft error
gate-level
signal probability
