摘要
利用智能 L CR测试仪、圆形平板电极系统和 PC计算机及自主开发的水果电特性无损检测软件 ,用非接触式无损检测方法在线测定了不同内部品质的苹果的电特性的差异。结果表明 ,在 5～ 10 0 k Hz的频率范围内 ,有腐烂或损伤的苹果的阻抗比完好的要小 ,但测试结果受频率漂移影响较大 ;在 33～ 10 0 k Hz频率范围内 ,有腐烂或损伤的苹果的相对介电常数比完好的要大 ,测试频率的变化对相对介电常数基本无影响 ;损耗因数的变化则无一定的规律性。因此 ,用相对介电常数来进行水果内部品质的判别是可行的。
Differences in dielectric properties of various quality of apples were measured nondestructively by use of LCR instrument, round parallel plate electrode, personal computer and the software of nondestructive measurement of dielectric properties of fruits. The results show that from 5 kHz to 100 kHz in frequency, the equivalent impedance of spoiled or damaged apples is less than that of intact apples, but the measurement results may be affected by the excursion of frequency. The dielectric constant of spoiled or damaged apples is more than that of intact apples, and from 33 kHz to 100 kHz in frequency, the dielectric constant is not affected by the excursion of frequency basically. The change of loss factor is anomalous. It is feasible that the dielectric constant can be adopted to distinguishing the internal quality of fruit.
出处
《农业工程学报》
EI
CAS
CSCD
北大核心
2000年第3期104-106,共3页
Transactions of the Chinese Society of Agricultural Engineering
基金
浙江省自然科学基金资助项目!(004-395224)
关键词
苹果
内部品质
电特性
无损检测
apples
internal quality
dielectric properties
nondestructive measurement
