摘要
集成电路受空间粒子辐射容易产生软故障。通过三模冗余、时间冗余和错误检测与纠正等电路结构设计加固方法可对其进行改善,有效增强其抗单粒子翻转的性能,有效防止因辐射产生的软故障。
Space particle radiation will cause soft fault in integrated circuit.By radiation hardened for circuit structure design such as TMR,time redundancy,EDAC,etc.,it can effectively enhance the resistance of SEU and prevent soft faults caused by radiation.
出处
《微处理机》
2013年第5期4-5,共2页
Microprocessors
关键词
单粒子翻转
时间冗余
加固设计
Single event effect
Time redundancy
Radiation hardened design
