摘要
为了解决高纯钽及其氧化物中杂质元素的测定问题 ,采用ICP AES测定方法 ,对测定中基体效应及光谱干扰进行了研究 ,讨论了分离速率、洗脱液量及其浓度等因素对基体分离效果和杂质元素回收率的影响 ,建立了简便、快速、准确测定高纯钽及其氧化物中杂质元素的新方法 .研究结果表明 :用该法测定高纯Ta2 O5 中 1 2种杂质元素回收率在 90 %～ 1 1 0 %之间 ,相对标准偏差小于 8 1 5 % .其准确度及精密度均较好 。
In order to determine high purity tantalum and its oxide, this paper adopted the determination way of ICP AES. The matrix effect and spectral interference of tantalum in ICP AES were studied. The speed of separation, the concentration and volume of eluent were investigated. A new simple, rapid and accurate method was developed for the determination of impurity in high purity tantalum and its oxide. The recovery of 12 elements is between 90%～110%, and the relative standard deviation is lower than 8.15%. The accuracy and precision of the method are satisfactory.
出处
《中南工业大学学报》
CSCD
北大核心
2000年第3期242-245,共4页
Journal of Central South University of Technology(Natural Science)
基金
国家星火科技计划资助项目! ( 990 2 31 D880 0 819)
关键词
钽
ICP-AES法
分离
氧化物
杂质元素
tantalum
ICP-AES method
matrix effect
spectral interference
ion-exchange resin
separation
