摘要
本文对波导内腔氧化腐蚀的原因和失效机理进行了分析,完成了对波导通路故障的准确定位。详细叙述了铜质基材镀银后氧化腐蚀现象的科学试验,通过量化分析的数据对比找出了大气中的NO2是导致波导内腔腐蚀的外因,同时分析密封结构设计的缺陷,确定了波导法兰密封圈失效是导致波导内腔腐蚀的内因。探讨了失效分析技术与工程结构设计的关系,描述了故障件失效分析的基本方法和有效判断的原则,验证了基于数据分析得出设计、工艺改进措施的步骤和方法,为工程上密封设计和防腐蚀工艺设计提供了借鉴。
In this paper, the Waveguide lumen of oxidative corrosion causes and failure mechanisms are analyzed, to complete the accurate positioning of the waveguide path failure. A scientific experiment of a sliver-plated copper substrate oxidation corrosion phenomenon is explained in detail. Through the quantitative analysis data comparison to identify the atmospheric NO2 led to the waveguide inner chamber corrosion external factors, flaws of the sealing structure design is analyzed at the same time. The wavcguide flange seal failure led to the waveguide inner chamber corrosion internal. Explore the relationship between the failure analysis technology and structural design, describe fault expiration analysis of the basic method and the principle of judgment, and verify the steps of the design and process improvements based on data analysis and methods, provide references for the seal design and anti-corrosion process design engineering.
出处
《现代制造技术与装备》
2013年第2期31-33,共3页
Modern Manufacturing Technology and Equipment
关键词
密封设计
失效分析
故障定位
腐蚀机理
seal design
failure analysis
fault location
corrosion mechanism
