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一种应用于高动态范围CMOS图像传感器的曝光控制技术 被引量:15

A Novel High Dynamic Range Exposure Control for CMOS Image Sensor
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摘要 针对提高CMOS图像传感器的动态范围,提出了一种新的组合滚筒式曝光技术。由目前现有的技术可知,多次滚筒式曝光一般选择在单帧的时间周期内完成。根据不同的曝光参数,CMOS图像传感器芯片输出不同的图像,然后再将其组合成一帧宽动态范围的图像作为最后输出。本文提出的方法,通过充分利用滚筒式曝光时的空闲电路资源,有效地缩短了相邻图像间的时间间隔。这种方法将多次滚筒式曝光穿插进行,实现对目标图像的多次成像,从而有效提高了系统效率和输出响应速度。 A new CMOS image sensor technology using combination rolling shutter to increase the dynamic range is described. Known from former methods, multiple rolling shutters are alternated in a single frame time. According to the different exposure parameters,sensor outputs different images,which combined to a wide dynamic range picture at last. By well using the free circuit resources when rolling shutter, this technology effectively shortens the time spacing between the two adjacent imaging. This presented method makes the rolling shutter interlaced to achieve the multiple imaging of the target object, so it has made a great improvement in term of system efficiency and output response speed.
出处 《传感技术学报》 CAS CSCD 北大核心 2013年第3期328-332,共5页 Chinese Journal of Sensors and Actuators
基金 国家自然科学基金项目(61036004 61274021)
关键词 CMOS图像传感器 安防监控 动态范围 滚筒式曝光 多次曝光 CMOS image sensor security surveillance dynamic range rolling shutter multiple exposure
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  • 1程开富.CMOS图像传感器的最新进展及其应用(待续)[J].电子与封装,2003,3(3):45-48. 被引量:4
  • 2姜秀彬,毛毳,何乐年.一个提高CMOS图像传感器的动态范围的算法[J].微电子学与计算机,2006,23(2):45-48. 被引量:5
  • 3Chapinal G.A 128×128 CMOS image sensor with analog memory for synchronous image capture[J].IEEE Sensors Journal,2002,2(2):120-126. 被引量:1
  • 4Scheffer D.Random addressable 2048×2048 active fixel image sensor[J].IEEE Transactions of Electron Devices,1997,44(10):1716-1720. 被引量:1
  • 5Hiwatashi K.Spatial Sine-wave Responses of the Human Visual System[J].Vision Res,1968,8(9):1245-1263. 被引量:1
  • 6Song Aiqun,Huang Yuanqing,Shi Jinchai.Applied Technique and Development Trend of CCD Image Sensor[C].ICEMI International Conference,2007:2840-2843. 被引量:1
  • 7Suni Paul P.CCD Wafer Scale Integration[C].Proceedings of the Annual IEEE International Conference on Wafer Scale Integration,1995:123-133. 被引量:1
  • 8Abe Hideshi.Device Technologies for High Quality and Smaller Pixel in CCD and CMOS Image Sensors[C].Technical Digest-International Electron Devices Meeting,2004:989-992. 被引量:1
  • 9Fife K,El Gamal A,Wong H S P.A 0.5 μm Pixel Frame-Transfer CCD Image Sensor in 110nm CMOS[C].IEEE International Electron Devices Meeting,2007:1003-1006. 被引量:1
  • 10Theuwissen Albert J P.The Hole Role in Solid-State Imagers[J].IEEE Transactions on Electron Devices,2006,53(12):2972-2980. 被引量:1

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