摘要
根据垂直扫描干涉技术结合样品折射率与密度间的依赖关系,建立了低密度SiO2泡沫微球密度的检测方法,用Lorentz-Lorenz和Gladstone-Dale公式分析了SiO2泡沫微球折射率与密度间的依赖关系。实验结果和测量误差估计表明,利用垂直扫描干涉技术并结合Gladstone-Dale分析方法,可实现对低密度SiO2泡沫微球密度的精密检测,其测量误差好于5%。
The measuring method based on vertical between refraction index and density of SiO2 foam shells scanning interference and combined with the relation is introduced, and the relation is analyzed according to formulas of Lorentz-Lorenz and Gladstone-Dale. The experimental result and measuring uncertainty evaluation indicate that the precision measurement of density of low density SiO2 foam shells can be realized by using the vertical scanning interference technique and combining with Gladstone ＆ Dale analysis method, and the measuring uncertainty is about 5%.
出处
《核聚变与等离子体物理》
CAS
CSCD
北大核心
2013年第1期88-91,共4页
Nuclear Fusion and Plasma Physics
基金
国家863计划项目资助课题
关键词
SiO2泡沫微球
密度检测
垂直扫描干涉
折射率
惯性约束聚变
SiO2 foam shell
Density measurement
Vertical scanning interference
Refraction index
Inertialconfinement fusion
