摘要
介绍了研究石英中杂质赋存状态的重要性以及原子力显微镜在石英表面分析中的应用,结果通过原子力显微镜我们能够看到石英表面颗粒分布均匀,结构致密,颗粒没有大尺度的起伏等表面结构,并且利用它高的分辨率得到了石英表面纳米级别的微观形貌,为后续的确定杂质赋存状态做了准备。
The importance of studying the impurity occurrence state and the application of atomic force microscopy（AFM） in surface analysis of quartz were introduced.The quartz grains were well distributed and had compact structure and non-large scale fluctuation.The nanometer level micro-morphology was obtained using high resolution of AFM,which made preparation for the subsequent determination of impurities occurrence state.
出处
《广州化工》
CAS
2012年第15期124-125,共2页
GuangZhou Chemical Industry
关键词
原子力显微镜
石英薄片
形貌分析
atomic force microscopy
quartz thin section
morphology analysis
