摘要
集成电路深亚微米制造技术和设计技术的迅速发展,使得基于IP核复用的SOC设计技术得到越来越广泛的应用,但由于IP核的来源不同,设计标准的不兼容等因素,使得SOC的测试变得越来越困难;IEEE为解决SOC的测试问题提出了嵌入式芯核测试标准IEEE Std 1500,致力于建立标准化的IP核供应商和用户之间的测试接口,简化核测试信息的复用;文章详细介绍了IEEE Std 1500标准的测试架构,使用方法和核测试描述语言CTL,同时给出标准中提出的SOC可测性设计方法。
The technology of IP core based on SOC design is widely used, which is attribute to the rapid development of deep submicron meter manufacture technology and design technology of integrated circuit. Because of the fact that IP cores usually come from different pro viders and the incompatibility of interface between IP core providers and core users and aims at improving ease of test reuse and test integration with respect to the core based SOC. 1500 standard for embedded core test is presented to solve this problem. The detail includes the test architecture, usage of this standard and core test description language.
出处
《计算机测量与控制》
CSCD
北大核心
2012年第5期1190-1193,共4页
Computer Measurement &Control
基金
国家自然科学基金资助项目(60871029)
