摘要
【目的】通过温185早实核桃(Juglans regia L.)一年生枝条抗寒力测定分析,筛选出与抗寒相关的关键生理指标,为有效评价不同栽培管理条件下"温185"核桃越冬抗寒能力,制定合理的冬季安全越冬技术措施提供理论依据。【方法】设置了9个胁迫低温处理,测定并分析了不同胁迫处理后温185一年生枝条的半致死温(LT50)、枝条组织活力、保护酶(SOD、POD、CAT)活性、丙二醛(MDA)含量、渗透调节物质(可溶性糖和游离脯氨酸)含量等指标。【结果】温185一年生枝条的半致死温度分别为-24.71℃;不同组织抗寒能力存在强弱差异,以表皮抗寒性最强,皮层、韧皮部和木质部冻害临界温度与LT50接近;随着胁迫温度的降低,MDA含量持续增加;SOD、POD和CAT活性峰值的激发胁迫温度均接近LT50,胁迫温度低于半致死温度时,保护酶活性明显下降;游离脯氨酸含量与相对电导率之间存在极显著的正相关关系。【结论】相对电导率和游离脯氨酸含量可作为温185一年生枝条抗寒力评价的关键生理指标,皮层、韧皮部和木质部的TTC染色结果可作为组织冻害的鉴别依据。
【Objective】 Annual branch cold resistance of Wen-185 early fruit walnut（Juglans regia L.） was measured to select correlated key physiology indexes for evaluating cold resistance in different cultivated conditions,as well as to provide theoretical basis to make proper hibernation technology practical.【Method】 9 treatments were set to measure and analyze the indexes of lethal temperature（LT50）,different tissue activities,enzyme activity,MDA value,osmoregulation substance value of the annual branches of Wen-185 walnut.【Result】LT50 of annual branch of Wen-185 walnut is-24.71℃.Cold resistance differs obviously among branch tissues in which epidermis showed better cold resistance than others.Freeze injury critical temperatures of cortex,liber and xylem correspond with LT50.MDA value increases continuously during cold stress temperature dropping.Activity peak values of SOD,POD and CAT of Wen-185 walnut annual branch correspond with LT50,and then drop rapidly at temperatures below LT50.Significant positive correlation was showed between proline value and relative conductance【Conclusion】 Key physiology indexes for evaluating annual branch cold resistance of Wen-185 walnut included relative conductance and proline value.Cortex,liber and xylem＇s TTC staining can be used as the key bases for tissue identification of freeze injury.
出处
《新疆农业科学》
CAS
CSCD
北大核心
2012年第3期454-460,共7页
Xinjiang Agricultural Sciences
基金
新疆维吾尔自治区财政林业科技专项资金课题"栽培管理措施与果树抗寒性关系研究"
关键词
核桃
一年生枝条
半致死温度
生理指标
抗寒力评价
Juglans regia L.
half lethal temperature
annual branch
key physiology indexes
cold resistance evaluating
