摘要
The surface structure of Cu,Al and γ Al2O3 have been investigated b y SEELFS and obtained nearest neighbor distances of the central atoms.The value s compared with those calculated according to theories shows that the errors wer e about 0.01－0.03nm before correcting the phase shifts.These results show the p ossibility of performing SEELFS technique by Auger electron spectrometer.
The surface structure of Cu,Al and γ Al2O3 have been investigated b y SEELFS and obtained nearest neighbor distances of the central atoms.The value s compared with those calculated according to theories shows that the errors wer e about 0.01－0.03nm before correcting the phase shifts.These results show the p ossibility of performing SEELFS technique by Auger electron spectrometer.
出处
《物理化学学报》
SCIE
CAS
CSCD
北大核心
2000年第2期101-104,共4页
Acta Physico-Chimica Sinica
基金
国家自然科学基金!(29733080)
关键词
SEELFS
表面分析
铜
铝
Γ-氧化铝
原子键长
SEELFS（EELFS）, Surface analysis, Nearest neighbor atomic distances, Copper, Aluminum, γ Alumina
