摘要
为了更好地利用频率特性测试仪,也称扫频仪(FSI),测量被测电路网络的幅频特性和相频特性,提出了一种基于FPGA核心的新型频率特性测试仪设计方案。并在此基础上实现了测量500 Hz至125 kHz带宽的幅频特性和相频特性的功能,各项指标的仿真结果与实测结果高度吻合,与点频测量法相比较误差在5%以内,并在小型化,数字化,低功耗方面有所特色。
In order to improve the test result of amplitude-frequency characteristic and phase-frequency characteristic of the quizzed network by the frequency characteristic instrument, also called FSI （ Frequency- Sweeping Instrument ）, a new FSI design based on FPGA is presented, which can test amplitude frequency characteristic and phase frequency characteristic from 500 Hz to 125 kHz. The simulated values are in agreement with the experimental results, and the relative error is less than 5 % compared with the method of testing every single frequency point. In addition, small volume, digital processing and low power consumption are also the features of this instrument.
出处
《电子器件》
CAS
2011年第6期713-717,共5页
Chinese Journal of Electron Devices
关键词
测试仪
幅频特性
相频特性
FPGA
数字化
instrument
amplitude-frequency characteristic
phase-frequency characteristic
FPGA
digital processing
