摘要
本文叙述了XRF测定地质样品中微量As,Ga,Co,Ni,Br,Cl,S和F的分析方法。采用压片法制样。对As,Ga,Co,Ni和Br元素,用散射内标法校正基体效应,而对Cl,S和F元素则用经验系数法进行基体校正。各元素的探测限(ppm)分别为:As 2.7,Ga 2.4,Co 2.8,Ni 2.5,Br 1.0,Cl,S 5.0,F 500。方法的精密度和准确度与其它化学方法相当,是一种简便快速和较灵敏的分析方法。
This paper describes a XRF method for the determination of micro amounts of As, Ga, Co, Ni, Br, CI, S and F in geological samples. The samples were prepared as briquets. The matrix effect was corrected by the scattered target-line ratio method for As, Ga, Co, Ni, Br and by the empirical influence coefficients for Cl, S, F. The lower limits of detection for As, Ga, Co, Ni, Br, Cl, S and F are 2. 7, 2. 4, 2. 8, 2. 5, 1. 0, 5. 0, 5. 0 and 500 ppm, respectively. Accuracy and precision of the method are comparable to those of the chemical analysis. This is a simple, rapid and more sensitive analytical method.
出处
《铀矿地质》
CSCD
北大核心
1990年第5期312-317,共6页
Uranium Geology
关键词
地质
样品
元素
砷
镓
荧光光谱法
Non-metal element, Determination, X-ray spectrometry
