摘要
对模拟芯片边界扫描测试方法进行了研究,结合IEEE1149.1标准框架结构和IEEE1149.4标准混合信号测试总线思想构建了模拟芯片边界扫描测试电路,运用了数字移位寄存器和模拟开关构成模拟边界扫描单元,并编写了TAP控制器及其它电路的VHDL代码,通过实验仿真验证了测试电路的可行性。测试电路可以完成模拟芯片的简单互连测试以及性能测试。
A study was made on the method of boundary scan test for analog integrated chip, and the circuit of boundary scan test for analog integrated chip was built based on the structure from IEEE1149.1 and the idea of mixed signal test bus from IEEEl149.4. The analog boundary module was formed with digital shift registers and analog switches. The code of TAP controller and other circuit were written with VHDL and the result of simulation shows that the test cycle can work as expected. With the test circuit, simple interconnection test and functional test can he performed on analog integrated chip.
出处
《计算机测量与控制》
CSCD
北大核心
2011年第11期2814-2817,共4页
Computer Measurement &Control
关键词
模拟芯片
边界扫描
TAP控制器
性能测试
analog integrated chip
boundary scan
tap controller
functional test
