摘要
本文用ＭＯＣＶＤ技术制备了Ｚ＿ｎＳ：Ｍ＿ｎ交流电致发光（ＡＣＥＬ）薄膜，用转靶衍射仪测量薄膜的Ｘ射线衍射谱，首次用二次离子质谱系统分析在薄膜中的分布，并对曲线的起伏给予解释。
In this paper,the Z_nS:M_n ACEL thin is sythesized by MOCVD technique. Thediffraction spectrum of X-ray of the thin is measured by rotational target diffraction instrument.The distribution of in the thin is analyzed for the first time by quadraric ionic mass spectrumsystem,The fluctuation of curve is explained.
出处
《内蒙古民族大学学报（自然科学版）》
1995年第2期134-138,共5页
Journal of Inner Mongolia Minzu University：Natural Sciences
基金
内蒙古教育厅科学基金
