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基于加速环境的可靠性指标验证试验 被引量:6

The Accelerated Testing to Estimate the Reliability Specifications
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摘要 首先进行了电子产品失效模型的理论研究,并利用加速退化试验技术而研究了某通信产品失效机理一致的应力范围,通过对试验数据进行的统计分析,计算出失效机理一致情况下的激活能。在可靠性指标验证的试验研究中,将试验样品分成若干组分别进行恒温加速验证试验,并将试验结果与现场统计数据进行比较,最终确定产品的MTBF。 The theory about the failure mechanism model of electronic products is studied.Through the accelerated degradation testing,the stress ranges for a communication product under consistent failure mechanisms can be achieved.Based on the statistical analysis of the testing data,the activation energy under consistent failure mechanisms is estimated.During the validation testing,the MTBF of the product is obtained by applying constant temperature accelerated testing to the grouped samples and then comparing the test results with the field statistical data.
出处 《电子产品可靠性与环境试验》 2010年第4期6-10,共5页 Electronic Product Reliability and Environmental Testing
关键词 加速退化试验 失效机理 激活能 指标验证 accelerated degradation testing failure-mechanism activation energy specification demonstration
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  • 1NELSON W. Accelerated testing: statistical models, test plans, and data analysis [ M ]. New York : John Wiley & Sons, 1990. 被引量:1
  • 2MEEKER W Q, Escobar L A. Statistical methods for reliability data[ M]. New York:John Wiley & Sons, 1998. 被引量:1
  • 3NELSON W. Analysis of performance degradation data from accelerated tests [ J]. IEEE Trans. On Rel., 1981, 30(2) :149 - 155. 被引量:1
  • 4WANG W D, DAN D D. Reliability quantification of induction motors-accelerated degradation testing approach[ C ]//Proceedings Annual Reliability and Maintainability Symposium, [ s. l. ] : 2002, 325 - 331. 被引量:1
  • 5Hu J M,Barker D,Dasgupta A,et al.Role of failure-mechanism identification in accelerated testing.Proceedings Annual Reliability and Maintainability Symposium,IEEE,1992:181 被引量:1
  • 6Redhead P A.Thermal desorption of gases.Vacuum,1962,12:203 被引量:1
  • 7Pasco R W,Schwarz J A.Temperature-ramp resistance analysis to characterize electromigration.Solid-State Electron,1983,26(5):445 被引量:1
  • 8Li Zhiguo,Song Zengchao,Cheng Yaohai.A study on GaAs FET's failure mechanism and experimental technology of rapid evaluation of reliability.Proceedings of IEEE Reliability Physics International Symposium,2003:576 被引量:1
  • 9Zhang Wanrong,Li Zhiguo,Mu Fuchen.A rapid evaluation method for degradation activation energy of n-GaAs ohmic contacts with and without TIN diffusion barrier layers.Proceedings of 8th IPFA,Singapore,2001:134 被引量:1
  • 10李志国,宋增超,孙大鹏,程尧海,张万荣,周仲蓉.GaAs MESFET可靠性及快速评价新方法的研究[J].Journal of Semiconductors,2003,24(8):856-860. 被引量:11

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