摘要
单粒子瞬变(SET)现象对高性能计算的影响日益严重,本文对高性能微处理器中锁相环(PLL)的RHBD(Radia-tion-Hardened-By-Design)加固方法进行了分析和总结,从系统级和电路级两个方面对PLL的SET加固方法进行了分类研究。分析结果表明,设计加固方法可以在较高的层次上考虑加固问题,降低了工艺依赖性,可以有效地提高PLL可靠性。
The radiation-hardened-by-design （RHBD） techniques were reviewed for single-event transients （SETs） in phase-locked loops within high performance microprocessors, as SETs induced soft errors increasingly affect the high performance computing applications. The circuit hardened strategies for SETs were discussed respectively in systematic view and circuit level. It was concluded that the hardened design could be developed at higher level to achieve high reliability of the PLL, which is not depending on the process.
出处
《计算机工程与科学》
CSCD
北大核心
2009年第A01期76-79,83,共5页
Computer Engineering & Science
基金
国家自然科学基金资助项目(60836004
60676010)
教育部博士点基金项目(20079998015)
长江学者和创新团队发展计划
