摘要
选择MgF2和ZnSe两种材料设计制作了一维缺陷光子晶体,从理论和实验上对带有缺陷的一维光子晶体的传光特性进行了研究。在实验中,一般用光谱仪来测量通过光子晶体的透射光谱,由于光谱仪价格较贵,这种方法不利于制作实用的光子晶体传感器。我们用CCD和光栅代替光谱仪,利用白光光源代替激光器,建立自动测量实验系统进行了实验研究。实验中利用压电陶瓷来改变缺陷层厚度,模拟缺陷层的变化,通过CCD测量衍射光位置来测量透过的光频。实验结果表明,缺陷层厚度的变化和透射光频率之间呈线性关系,通过测量透射光频的变化,可以测量引起缺陷层变化的物理量,这与理论分析一致,说明本实验方法可行。本实验方法研制实用的光子晶体传感器具有一定意义。
MgF2 and ZnSe are separately used to create photonic crystal with defect layer, and the characteristics of the photonic crystal has been studied in theory and experiment. In experiment, a spectrum analyser is generally used to measure the spectrum of transmitted light which traverses phonic crystal. But it is not a good way to create practical phonic crystal sensor due to the high price of spectrum analyser. By using CCD camera and grating instead of spectrum analyser, and using white light source instead of laser, we construct the automatic experiment system. The width of defect layer is changed by piezoelectric actuator. By using white light source, we find that the light frequence of transmission can be determined by measuring the site of refractive light. The experiment results show that the relation between change on defect layer width and transmission light frequency is linearity, and demonstrates that we can measune the change of defect layer through the change of light frequence of transmission, which conforms to the theoretical analysis. This experimental method has some significant meaning to make practical photonic crystal sensor.
出处
《量子光学学报》
CSCD
北大核心
2009年第3期260-263,共4页
Journal of Quantum Optics
基金
贵州省省长基金项目(黔省专合字2005326)
