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高Q腔法测试透波材料毫米波复介电常数 被引量:3

Millimeter Wave Complex Permittivity Measurement for Low Loss Dielectric Disks by High Q Resonance Cavity Method
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摘要 介绍了透波材料毫米波复介电常数自动测试方法,采用高Q腔一腔多模扫频(18~40GHz)方法测试了微波低损耗圆盘状介质材料,谐振腔工作在TE10p模式,电场的极化方向平行于样品表面。为适应毫米波段材料测试的要求,在设计测试用宽频高Q值谐振腔时,改变以往工作中腔壁开槽位置以抑制TM1mn简并模,对测试用谐振腔的设计大大减小了测试误差。用此系统对几种低损耗材料进行测量,结果证明谐振腔有效抑制了干扰模式,减小了测试误差。对测试结果进行了误差分析,系统的最可几测试误差为:|Δεr/εr|=2%;|Δtanδ|=10%tanδ+5×10-5。 The complex permittivity of low loss microwave dielectric disk was measured by applying high Q faetor cylindrical cavity working in multimode. The cavity worked in TE10p mode , the polarization direction of electric field was parallel to the plane of the disk. Because of high measurement frequency, we displased the groove which separated resonant frequency of the degenerating TM1mn mode to the uper end plate of the cavity and decreased the groove between dielectric disk and cavity wall. As a result, the error of measurement is greatly decreased. The complex permittivity of several kinds of low-loss material were measured by using this method mentioned in this paper. The results were satisfactory. The maximum random error: | △εr/εr|=2%;|△tanδ|=10%tanδ+5×10^-5.
出处 《宇航材料工艺》 CAS CSCD 北大核心 2009年第1期82-84,共3页 Aerospace Materials & Technology
关键词 圆柱谐振腔 复介电常数 微波测试 Cylindrical cavity, Complex permittivity, Microwave measurement
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  • 1曹江.介质材料电磁参数测量综述[J].宇航计测技术,1994,13(3):30-34. 被引量:31
  • 2[1]BAKER-JARVIS J,JANEZIC M,RIDDLE B,et al.Dielectric and conductor-loss characterization and measurements on electronic packaging materials[M].NIST Technical Note 1520, 2001. 被引量:1
  • 3[4]KOBAYASHI Y,SHIMIZU T.Millimeter wave measurements of temperature dependence of complex permittivity of dielectric plates by a cavity resonance method[A].IEEE MTT Symp.[C].1999,1885-1888. 被引量:1
  • 4[5]ZHANG G,NAKAOKA S,KOBAYASHI Y.Millimeter wave measurements of temperature dependence of complex permittivity of dielectric plates by the cavity resonance method[A].APMC '97[C].1997.3913 -3916. 被引量:1
  • 5[6]SHIMIZU T,KOBAYASHI Y.Millimeter wave measurements of temperature dependence of complex permittivity of GaAs disks by a circular waveguide method[A].2001 IEEE MTT Symp.[C].2001,2195-2198. 被引量:1
  • 6[8]汤世贤.微波测量[M].北京:电子工业出版社,1990. 被引量:1
  • 7Baker-Jarvis J. Transmission/reflection and short-circuit line permittivity measurements. NIST Technical Note 1341,1990. 被引量:1
  • 8Gregory A P, Etzel S, Clarke R N. Precise measurements on dielectric reference liquids over the temperature range5-50/spl deg/C using coaxial line methods. Precision Electromagnetic Measurements Digest,2000:455 ~456. 被引量:1
  • 9李恩 郭高凤 张其劭.X波段矩形波导TRL变温校准技术[A]..见:全国电子测量及仪器学术研讨会论文集[C].,2002.496-500. 被引量:1
  • 10Hauschild T, Knochel R. Measurement of complex permittivity of solids up to 1000/spl deg/C. Microwave Symposium Digest, IEEE MTT-S International , 1996; (3): 1 687 ~1 690. 被引量:1

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