摘要
采用TE_(015)模高Q圆柱腔对X波段低损耗介质材料的复介电常数进行了变温测试,电场的极化方向平行于样品表面。可测温度范围为常温到200℃。在所有温度点上,空腔的无载品质因数均大于40000。复介电常数的测试范围ε_r:1.05～10,tanδ:3×10^(-2)～5×10^(-5),测试系统的最可几误差为|△ε_r|/ε_r|=1.5％,|△tanδ|=10％tanδ+3.0×10^(-5)。
The temperature dependence of the complex permittivity of low-loss dielectric material (plate) is measured by using a TE015 mode cylindrical cavity with high unloaded quality factor over 40,000. The polarization direction of the electrical filed is parallel to the surface of the sample. The measurable temperature varies from room temperature to 200℃ . The range of measurable complex permittivity is εr: 1.05 - 10, tanδ:3 × 10-2 -5×10 , and the most probable measurement error is |△εr/εr| =1.5%,|△tanδ|10%tanδ+3.0×10-5.
出处
《航空材料学报》
EI
CAS
CSCD
2003年第z1期194-197,共4页
Journal of Aeronautical Materials
关键词
低损耗介质
复介电常数
变温
圆柱腔
微波测量
low-loss dielectric
complex permittivity
variable,temperature
cylindrical cavity
microwave measurement
