摘要
介绍了特征X射线的测厚原理、测厚系统组成及数据处理方法,并利用铜和铁的特征X射线对纸张厚度进行了实验研究;当被测量纸张的厚度从7.2mg/cm2到43.2mg/cm2时dm与ln I曲线的相关系数达到0.999以上,测量相对误差在2%以内。
The composition and principle of characteristic X-ray measurement system are introduced in detail, and the method of data processing is explained in this article, this experiment selects and uses copper and iron being target matter, Use characteristic X-ray measuring paper thickness. While the thickness paper is measured arrives at 43.2 mg/cm^2 from 7.2 mg/cm^2, the curvilinear relevance modulus of dm and lnI is more than 0. 999 , relative error within 2%.
出处
《核电子学与探测技术》
CAS
CSCD
北大核心
2009年第1期81-83,104,共4页
Nuclear Electronics & Detection Technology
关键词
特征X射线
测厚系统
数据处理
characteristic X-ray
measurement system
data processing
