摘要
非均匀性校正是红外焦平面阵列成像质量提高的关键,在现有一元线性理论模型局限下,红外焦平面阵列成像非均匀性校正难以获得校正精度的提高.本文通过红外焦平面阵列探测器成像机理及其成像过程理论分析,推导了影响探测器响应及其非均匀性的主要因素,首次建立了红外焦平面阵列二元非线性的非均匀性理论模型,通过实验测试及其统计分析验证了理论模型.该模型能在较宽红外辐射和环境温度范围内准确预测红外焦平面阵列响应曲线及其非均匀性,比原一元线性理论模型更全面准确地描述了红外成像非均匀性影响因素及探测器响应关系.
Nonuniformity correction is the key issue for the image quality improvement of infrared focal panel arrays imaging. But the nonuniformity correction precision is difficult to improve based on existing monadic linear theoretical model. Infrared focal panel array photoelectric response mechanism and its imaging process were analyzed. The main influence factors for infrared sensor response and its nonuniformity were deduced. A binary nonlinear nonuniformity theoretical model for infrared imaging was present for the first time. Experimental test results were given. Test and statistic analysis results show that the model give reasonable prediction of the responsive curve for infrared focal panel arrays sensor in wider infrared scene radiation and surrounding temperature range. Furthermore, this model reveals comprehensive influence factors of IRFPA response and nonunfformity differ from the existing monadie linear theoretical model.
出处
《电子学报》
EI
CAS
CSCD
北大核心
2008年第11期2150-2153,共4页
Acta Electronica Sinica
基金
近程高速目标探测技术国防重点学科实验室资助
国防预研项目(No.40405030103)
江苏省自然科学基金重点项目(No.BK2008049)
关键词
红外成像
红外焦平面阵列
非均匀性模型
二元非线性
infrared imaging
infrared focal panel arrays （IRFPA）
nonuniformity model
binary nonlinear
