期刊文献+

基于S3C2410x的JTAG检测平台的设计与实现

Design and implementation of JTAG testing system based on S3C2410x
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摘要 阐述了边界扫描技术的基本原理,从设计方法和实现技术方面对基于边界扫描技术的芯片短断路检测设计进行了研究,并给出了具体的实现方法;以针对CPU为BGA封装的电路板设计了一套短路、断路故障检测平台为例,经验证,该设计有效地缩短了电路板的生产、周期,并且可排除PC独立运行,降低了其维修测试费用,因而将具有更为广泛的应用前景。 The basic principle of boundary scan technique is presented. The design for detecting the short or open circuit problem of integrated circuit chip based on the boundary scan technique is researched from designing method and realization technique. And some concrete implementing methods are given. An example is taken for designing a detecting system for the short or open circuit problem of the circuit board with Ball Grid Array(BGA) CPU. The result shows that, by using this method, the producing period of the circuit board with the BGA CPU can be effectively shortened, and the cost of maintenance and test can be reduced for off-line with PC. So it wiU be applied in more fields widely.
出处 《信息技术》 2008年第11期53-55,59,共4页 Information Technology
关键词 边界扫描 JTAG BGA 电路板 短路 断路 boundary scan JTAG BGA circuit board short circuit open circuit
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参考文献10

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二级参考文献11

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