摘要
应用X线头影测量McNamara分析法对上海地区57例正常青少年颅颌线距测量值进行相关性分析。结果表明，有效上颌长度和有效下颌长度间，上颌突度和下颌突度间存在相关性。前下面高和下颌突度在一定条件下相关。同时作出回归方程，为研究颅颌线距的定量关系提供参考。
The craniomaxillary linear parameters of 57 Shanghai adolescents with normal occlusion were evaluated by using McNamara analysis. The results showed that there were significant correlations between effective maxillary length and effective mandibular length, and between Nasion perpendicular to point A and Pogonion to nasion perpendicular. Under certain conditions, Pogonion to nasion perpendicular and lower anterior facial height were also correlated.The regression equation was presented.
出处
《上海第二医科大学学报》
CSCD
1997年第6期445-447,共3页
Acta Universitatis Medicinalis Secondae Shanghai
