摘要
为了向可重复播种的LFSR结构提供种子,提出一种基于动态覆盖率提高门槛值(Dynamic Coverage Im-provement Threshold,DCIT)的种子计算方法.使用该方法计算得到的种子进行重复播种,能够截断对提高故障覆盖率效率低的测试码序列.每个种子可以得到长度固定的伪随机测试序列.以ISCAS85基准电路实验结果表明,该方案能够在不降低故障覆盖率的前提下,减少测试矢量长度、缩短测试时间和降低测试功耗.
This paper presents a new approach which can supplies the seeds for the linear feedback shift register （LFSR） reseeding on the dynamic coverage improvement threshold （DCIT）. The method is simple and effective, After reseeding with the seeds which are calculated by this way, the ineffective pseudo-random test vector sequence will be truncated. Every seed produces the same length pseudo-random test patterns. The experiments on ISCAS85 benchmark circuits demonstrate that the scheme can reduce the test patterns length, shorten the test time and decline the test power consumption.
出处
《微电子学与计算机》
CSCD
北大核心
2008年第8期164-167,共4页
Microelectronics & Computer
