摘要
建立了用于波片位相延迟测量的高精度多功能测试系统,实现了在同一测试系统上应用不同的测试方法,使测试具有可比性。对光谱扫描法、Soleil补偿器法及两种光强法进行了比较测量,并结合测试结果对各种方法进行了系统的误差分析。分析结果表明,对本测试系统而言,光谱扫描法适于测量λ/2波片,测量精度主要由单色仪的精度所决定,其误差<0.032%;Soleil补偿器法测量精度主要由Soleil补偿器精度决定,其误差<0.18%;光强法误差与待测波片的延迟量有关,且测试光路与偏振器的缺陷对测量精度影响较大。光谱扫描法与Soleil补偿器法测量λ/2波片的结果在误差范围内相符,光强法测量结果产生较大差异的原因来自光路、偏振器及方法本身的缺陷。实验结果为不同条件下选择最佳测量方法提供了参考依据。
In order to optimize the measuring methods of waveplate retardation and determine the discrepancy in experimental results from different measuring methods and instruments, a high-precision muhifunctional experimental system was established to measure the waveplate retardation in different measuring methods and to make a comparison with these methods. A comparative experiment of scanning spectrum method, Soleil compensator method and two light intensity measuring methods was carried out. Combined with the experimental results, the errors of these methods were analyzed. The results show that the scanning spectrum method is appropriate for measuring λ/2 waveplate with error less than 0. 032%, whose measurement accuracy is mainly determined by the accuracy of monochromator; The error of Soleil compensator method is less than 0.18%, which primarily comes from the accuracy of Soleil compensator, and for the measurement of λ/2 waveplate, scanning spectrum method and Soleil compensator method can verify each other within the error limits; The error of the light intensity measuring methods is related to the sample waveplate retardation, defects of optical path atrangement, polarizers and the defects from measuring methods.
出处
《光学精密工程》
EI
CAS
CSCD
北大核心
2007年第11期1678-1685,共8页
Optics and Precision Engineering
基金
国家自然科学基金资助课题(No.10473016)
中国科学院方向性资金资助项目(No.KJCX2-T04)
国家973资金资助项目(No.2006CB806301)
关键词
应用光学
波片
位相延迟
误差分析
applied optics
waveplate
retardation
error analysis
