摘要
本文将电子探针定量分析中的一个厚块状样品的校正程序,扩展为微粒样品的校正程序。修改后的程序,不但仍可用于厚块状样品的校正,而且对不同直径的微粒样品也可进行校正计算。文中比较了几种不同的校正程序对微粒样品的校正计算结果。直径1-4μm的硫化铁微粒和直径0.4-4μm的五元钴基合金微粒,采用本文提示的程序,其校正精确度分别优于4％和10％,说明修改后的程序对微粒样品的校正是合适的。
In this paper a new correction program was proposed. The program can be applied not only to the flat thick bulk samples, but also to the microparticles. It can classify particles according to the particle's diameter automatically, and take different expression. The results obtained with different correction programs was compared. The analytical errors of FeS and Cobalt alloy microparticles are not more than 4% and 10%, respectively. It shows that the correction program des-cribed in this paper may be effective in correction calculation of mic-roparticle samples in practice.
出处
《电子显微学报》
CAS
CSCD
1989年第2期59-66,共8页
Journal of Chinese Electron Microscopy Society
