摘要
本文首先介绍了原子力显微镜的基本原理,硬件结构和工作模式,其次将原子力显微镜在淀粉颗粒结构研究中的应用做了一个简要的综述。利用原子力显微镜观察淀粉颗粒表面和内部的精细结构,对比较不同植物学来源的淀粉和在淀粉颗粒结构上考察基因突变对淀粉的影响,以及在淀粉糊化或贮藏的回生阶段追踪淀粉颗粒结构的变化都具有十分重要的辅助意义。
The basic principals of Atomic Force Microscopy （AFM） was introduced firstly in this paper, and then its application in starch granule structure research were reviewed briefly. It was an important complementary instrument of observing exquisite surface and inner structure of starch granules, which could be used in comparing different botanical starches and examining the effect of mutation on starch from starch granule structure aspect and following the changes during the pasting or retrogradating of starch.
出处
《中国食品添加剂》
CAS
2006年第6期157-161,共5页
China Food Additives
关键词
原子力显微镜
应用
淀粉
颗粒结构
atomic force microscopy （AFM）
application
starch
granule structure
