摘要
大面积有序的不同直径的镍纳米线阵列在多孔氧化铝模板中通过直流电化学沉积制备,利用X光衍射研究了它们的生长方向。充分利用X光的特点对镍纳米线阵列的正反两面进行了测量,结果发现随着纳米线直径的增加,镍纳米线方向向由[110]方向开始向[111]方向转变。并且,利用高分辨透射电镜进行观测,结果发现和XRD得到的结果是一致的。这进一步说明了利用X光来研究纳米线的生长方向既简单又准确,该方法将在以后的纳米器件的研究中起到重要的作用。
Large-area ordered Ni nanowire arrays with different diameters have been fabricated by the direct current electrodeposition into the holes of porous anodic alumina membranes（AAMs）. The growth orientation of Ni nanowire arrays is studied by X-ray diffraction（XRD）. According to the characteristic of X-ray, the top and bottom of Ni nanowire arrays were measured. The results indicate that the orientation growth direction of Ni nanowires turns from [ 110] to [ 111 ] direction with increasing diameters of nanowire, which is in good agareement with the observation of high-resolution transmission electron microscopy. The present studies show that XRD is a simple and exact method for the research of the growth orientation of nanowires, which plays an important role in the research of nanodevices in future.
出处
《科学技术与工程》
2006年第18期2994-2996,共3页
Science Technology and Engineering
